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Scalable High-Speed Digital Test Technology |
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Ultra-Compact HSIO Test Instruments Interface to any ATE |
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Compact size for easy integration |
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Our instrument modules leverage DFT Microsystems’ industry-leading compact serial test technology and provide enhanced transmitter and receiver test coverage for interfaces such as PCI Express, SATA, HDMI, USB 2.0, MIPI, XAUI, CPRI, DIGRF, SMIA, Display Port and SRIO. These interfaces are prevalent in popular consumer-oriented products such as wireless baseband ICs, display controllers, and microcontrollers. |
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Targeted Applications
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PCI Express SATA HDMI USB 2.0 MIPI XAUI
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DIGRF SMIA Display Port SRIO SONET CPRI |
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Features and Benefits Through various design innovations, our modules enable rapid applications development for the ever-evolving physical layers in HSIO-based ICs. The modules are self contained and fully calibrated, they offer seamless correlation between the laboratory and the ATE environments, and they include advanced AC parametric test capability at Gbps rates; capability that is scalable, reconfigurable, and highly affordable. |
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Design Our modules have been designed to enable the feature-rich capabilities required for HSIO testing while maintaining cost and ease-of-use requirements. Our products feature a standard mezzanine connector interface to our customers’ ATE application boards. They also feature a low-frequency and low-overhead digital control mechanism. |
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Example Application-Board Integration |
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Advanced Application Support |
