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Scalable High-Speed Digital Test Technology |
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Low-Cost, High-Density Board and Backplane PHY Test Solutions |
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DFT Microsystems offers standard PHY test solutions for the embedded computing industry. As this industry migrates to high-speed serial fabric technology, significant signal-integrity design and test hurdles have to be overcome. Blade designers, system integrators, and end users can all benefit from these highly specialized, yet fully characterized, measurement solutions. |
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Features and Benefits As serial fabric technology gets adopted in the embedded computing world, various cost, performance, and signal-integrity challenges emerge. Our test solutions enable the tuning, for BER optimization, of transmitter and receiver parameters within an assembled backplane. They also provide characterization features across all lanes and all slots of a serial fabric architecture, thus tremendously enhancing productivity. |
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Design Our massively parallel test equipment allows for a thorough validation of high-speed serial connections on advanced backplane systems. Automation suites exist for a One-Click characterization of backplane channels or for the evaluation of receiver and transmitter circuitry. |
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Targeted Standards
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VPX Advanced TCA MicroTCA |
