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Scalable High-Speed Digital Test Technology |
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The DV1600-PCIe is a member of the DV1600 series of massively-parallel high-speed validation testers from DFT Microsystems. It includes 16 high-speed test lanes and automation test software for complete physical-layer characterization of PCI Express Gen2 chips, boards, and systems. Through massive parallelism, the DV1600-PCIe drastically reduces the time to characterize key parameters such as bit error rate, receiver sensitivity, transmitter jitter, and reference clock jitter transfer. |
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Applications and Benefits Rapid add-in card and motherboard validation Production testing of add-in cards Massively-parallel data collection Ease of use |
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Features Plug-and-play validation of any PCIe device Fully-configurable lane support: 1 to 16 DUT transmitter amplitude, timing, and BER measurement DUT receiver voltage and jitter sensitivity measurement Versatile data logging. Learn more > |
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DV1600-PCIe SerDes Validation Tester |
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Features | Overview | One-Click Advantage |