Instrumental

System-Level Characterization and Test Products

Most economical high-speed and mixed-signal test solutions

DFT Microsystems offers the most economical high-speed digital test technology in the industry. The  low cost of acquisition for our tools, their extensive parallelism, and there extreme ease-of-use all result in unparalleled expenditure savings and productivity enhancements. Our tools find use in areas of chip characterization/validation, high-speed board and chassis characterization/validation, and system-level test.

BOST Modules

DJ60 (3.2 Gbps)

DJ60HS (6.4 Gbps)

DJ70 (12.5 Gbps)

Integrated SerDes Testers

DJ1000 3.2 Gbps parallel BERT with jitter injection

DV1600 6.4 Gbps SerDes Port Validation Tester

DV1700 12.5 Gbps SerDes Port Validation Tester

Introspect ESP

For FPGA systems

For system-level test

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